ITEA is the Eureka Cluster on software innovation
ITEA is the Eureka Cluster on software innovation
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Flaky test detection

Project
18022 IVVES
Description

During software development, it is often common that some automated tests start to randomly fail, but finding those tests is a tedious and time-consuming problem. Flaky tests detection solves that problem by processing historical xunit test results and checks which tests changes state most often.

Contact
Mark van Helvoirt, Philips
Email
mark.van.helvoort@philips.com
Technical features

Open Source Code: https://github.com/F-Secure/flaky-tests-detection https://github.com/F-Secure/flaky-tests-detection/issues

Input(s):

  • xunit test result files
  • csv file

Main feature(s):

  • Visualize tests which state changes most often

Output(s):

  • Calculation of test names which state changes most often
  • Heatmap
Integration constraints
  • Python 3.7 or never
  • pandas
  • junitparser
  • seaborn
  • matplotlib
Targeted customer(s)

Software development team members, like developers and QA people. Teams with CI pipeline with decent amount of test automation result.

Conditions for reuse

Apache License 2.0

Confidentiality
Public
Publication date
23-11-2022
Involved partners
Philips Electronics Nederland BV (NLD)